Experimental evaluation of TCP protocols for high-speed networks
Li, Yee-Ting and Leith, Douglas J. and Shorten, Robert N. (2007) Experimental evaluation of TCP protocols for high-speed networks. IEEE/ACM Transactions on Networking, 15 (5). pp. 1109-1122. ISSN 1063-6692 AbstractIn this paper, we present experimental results evaluating
the performance of the scalable-TCP, HS-TCP, BIC-TCP,
FAST-TCP, and H-TCP proposals in a series of benchmark tests. In summary, we find that both Scalable-TCP and FAST-TCP consistently exhibit substantial unfairness, even when competing flows share identical network path characteristics. Scalable-TCP, HS-TCP, FAST-TCP, and BIC-TCP all exhibit much greater RTT unfairness than does standard TCP, to the extent that long RTT flows may be completely starved of bandwidth. Scalable-TCP,
HS-TCP, and BIC-TCP all exhibit slow convergence and sustained unfairness following changes in network conditions such as the start-up of a new flow. FAST-TCP exhibits complex convergence behavior. | Additional Information: | "©0007 IEEE. Reprinted from IEEE/ACM Transactions on Networking. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4346548 |
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| Keywords: | Performance evaluation; Transport protocols; Evaluation of TCP protocols; TCP congestion control; High-speed networks; BIC-TCP; FAST-TCP; H-TCP; HS-TCP; TCP protocols; Experimental evaluation; Scalable-TCP; Hamilton Institute.
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| Subjects: | Science & Engineering > Computer Science Science & Engineering > Hamilton Institute |
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| ID Code: | 1726 |
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| Deposited By: | Hamilton Editor |
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| Deposited On: | 10 Dec 2009 15:12 |
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| Journal or Publication Title: | IEEE/ACM Transactions on Networking |
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| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
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| Refereed: | Yes |
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| URL: | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=90 |
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