Lawlor, Eddie and Farrell, Ronan
Embedded Test Engine For Efficient At-Speed Scan Testing and Performance Binning of Microprocessors.
In this paper a modified architecture for
at-speed scan testing is presented. This new
architecture addresses the trend in the
semiconductor industry for increased at-speed
structural testing. The proposed architecture offers
reduced time for standard at-speed testing, and, in
particular, substantial savings for the repeated atspeed
testing required for microprocessor speed and
performance binning. The architecture has been
demonstrated on UMC 0.18Î¼m and has achieved
with little die overhead.
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||at-speed scan testing, performance
speed binning, design-for-test, embedded test.
||Science & Engineering > Electronic Engineering
Dr. Ronan Farrell
||04 Jul 2007
||IEEE: Institute of Electrical and Electronics Engineers
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