Author: Flood, BenNumber of items: 1.
Wilson, Simon and Flood, Ben and Goyal, Suresh and Masher, Jim (2007) Parameter Estimation for a Model With Both Imperfect Test and Repair. VLSI Test Symposium, 2007, 25th IEEE . pp. 271-276. ISSN 1093-0167 This list was generated on Fri May 25 19:01:53 2012 IST. |
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