	NUI Maynooth ePrints and eTheses Archive
	Home \| About \| Browse \| Search \| Register \| User Area \| Help \| As Gaeilge\| Statistics\| eTheses

Author: Lynn, S.

Number of items: 1.

Ragnoli, E. and McLoone, S. and Lynn, S. and Ringwood, J. and Macgearailt, N. (2009) Identifying key process characteristics and predicting etch rate from High-Dimension Datasets. Advanced Semiconductor Manufacturing Conference, 2009. . viii-ix. ISSN 1078-8743

This list was generated on Fri May 25 19:03:38 2012 IST.

NUI Maynooth ePrints and eTheses Archive is maintained by the Library.

Contact the site administrator at: s.redmondmaloco@nuim.ie