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NUI Maynooth ePrints and eTheses Archive |
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NUI Maynooth ePrints and eTheses Archive |
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Author: Srinivasan, PrakashNumber of items: 1.
Srinivasan, Prakash and Farrell, Ronan and Ward, Eamon (2008) Modular Scan Test for SoC Design. In: Intel European Research and Innovation Conference, 10-12 September 2008 , Leixlip, Ireland . This list was generated on Sat May 26 19:06:58 2012 IST. |
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